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About this Materials Science article
Monte Carlo Modeling of the Low-loss Electron Signal in Scanning Electron Microscopy and Comparison with the BSE Signal by Bonet, C; Pratt, A; El-Gomati, M; Matthew, JAD; Tear, SP is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Bonet, C; Pratt, A; El-Gomati, M; Matthew, JAD; Tear, SP
- Publisher
- Cambridge University Press; Cambridge University Press (CUP) (ISSN 1431-9276)
- Published
- 2008
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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