About this scholarly article

2008 Asia-Pacific Symposium on Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility - The probabilistic analysis of immunity of a data transmission channel to the influence of periodically repeating voltage pulses by Parfenov, Yuri V.; Kohlberg, Ira; Radasky, William A.; Titov, Boris A.; Zdoukhov, Leonid N. is a scholarly article available to read on EtoBox.

Author

Parfenov, Yuri V.; Kohlberg, Ira; Radasky, William A.; Titov, Boris A.; Zdoukhov, Leonid N.

Publisher

IEEE

Published

2008

Language

EN