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Model for Analysis of XPS Electron Take-off Angle Experiments in Layer-structured Samples: Determination of Attenuation Lengths in a Well-characterized Langmuir-Blodgett Film by Suzuki, Noboru; Iimura, Ken-ichi; Satoh, Shin; Saito, Yoshinari; Kato, Teiji; Tanaka, Akihiro is a Engineering article available to read on EtoBox.
What is Model for Analysis of XPS Electron Take-off Angle Experiments in Layer-structured Samples: Determination of Attenuation Lengths in a Well-characterized Langmuir-Blodgett Film about?
A series of equations have been proposed to calculate take-o † angle dependency of the elemental composition of layer-structured models from the experimentally obtained peak intensities of XPS. We have measured the take-o † angle dependency of XPS peaks of O 1s, C 1s, Si 2p and Cd 3d from a well-characterized one-layer Langmuir-Blodgett (LB) Ðlm of polymerized cadmium 10,12-pentacosadiynoate on a silicon wafer substrate and have applied the newly proposed equations to deduce attenuation lengths of photoelectrons for every element in the layerstructured organic materials. From the best Ðtting between the theoretically calculated and the experimentally obtained data by the least-squares method, attenuation lengths for a monolayer Ðlm of polymerized cadmium 10,12-pentacosadiynoate have been evaluated to be 3.4, 3.7, 4.0 and 4.5 nm for the respective photoelectrons of O 1s (955 eV), Cd (1082 eV), C 1s (1202 eV) and Si 2p (1388 eV) with the kinetic energy dependency of E0.75. 3d 5¿2 It is essential to use polymerized LB Ðlms and to conÐrm the surface structure of the Ðlm directly by suitable techniques such as atomic force microscopy, scanning electron microscopy or transmission electro
Who reads Model for Analysis of XPS Electron Take-off Angle Experiments in Layer-structured Samples: Determination of Attenuation Lengths in a Well-characterized Langmuir-Blodgett Film?
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- Author
- Suzuki, Noboru; Iimura, Ken-ichi; Satoh, Shin; Saito, Yoshinari; Kato, Teiji; Tanaka, Akihiro
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley; Research Square (ISSN 0142-2421)
- Published
- 1997
- Language
- EN
- Field
- Engineering (Physical Sciences)