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About this Physics and Astronomy article

Depth Resolution Function of the Laser Assisted Tomographic Atom Probe in the Investigation of Semiconductors by Cadel, Emmanuel; Vurpillot, François; Lardé, Rodrigue; Duguay, Sébastien; Deconihout, Bernard is a Physics and Astronomy article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Physics and Astronomy.

Author
Cadel, Emmanuel; Vurpillot, François; Lardé, Rodrigue; Duguay, Sébastien; Deconihout, Bernard
Publisher
American Institute of Physics; AIP Publishing; Publons (ISSN 0021-8979)
Published
2009
Field
Physics and Astronomy (Physical Sciences)

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