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About this Physics and Astronomy article
Depth Resolution Function of the Laser Assisted Tomographic Atom Probe in the Investigation of Semiconductors by Cadel, Emmanuel; Vurpillot, François; Lardé, Rodrigue; Duguay, Sébastien; Deconihout, Bernard is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Cadel, Emmanuel; Vurpillot, François; Lardé, Rodrigue; Duguay, Sébastien; Deconihout, Bernard
- Publisher
- American Institute of Physics; AIP Publishing; Publons (ISSN 0021-8979)
- Published
- 2009
- Field
- Physics and Astronomy (Physical Sciences)