About this scholarly article

2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 2000 (Cat. No.00CH37072) - Measuring efficiency of semiconductor manufacturing operations using data envelopment analysis (DEA) by Carbone, T.A. is a scholarly article available to read on EtoBox.

Author

Carbone, T.A.

Publisher

IEEE

Published

2000

Language

EN