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About this Engineering article
The Effect of Annealing on Amorphous Indium Gallium Zinc Oxide Thin Film Transistors by Hyeon-seok Bae; Jae-Hong Kwon; Seongpil Chang; Myung-Ho Chung; Tae-Yeon Oh; Jung-Ho Park; Sang Yeol Lee; James Jungho Pak; Byeong-Kwon Ju is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Hyeon-seok Bae; Jae-Hong Kwon; Seongpil Chang; Myung-Ho Chung; Tae-Yeon Oh; Jung-Ho Park; Sang Yeol Lee; James Jungho Pak; Byeong-Kwon Ju
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 2010
- Language
- EN
- Field
- Engineering (Physical Sciences)