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About this Engineering article
Performance and Reliability of Au and Pt Single-Layer Metal Nanocrystal Flash Memory Under nand (FN/FN) Operation by Singh, P.K.; Hofmann, R.; Singh, K.K.; Krishna, N.; Mahapatra, S. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Singh, P.K.; Hofmann, R.; Singh, K.K.; Krishna, N.; Mahapatra, S.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 2009
- Field
- Engineering (Physical Sciences)
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