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Genetic Algorithms for Test Pattern Generation by Dhwal Mehta is a document available to read on EtoBox.

What is Genetic Algorithms for Test Pattern Generation about?

This paper proposes a new genetic algorithm approach to automatically generate test patterns for large synchronous sequential circuits. The method exploits the computational power of a workstation network to tackle circuits that were previously too large. Experimental results show the network-based approach can achieve the same fault coverage as previous methods with an order of magnitude less CPU time on the largest circuits tested.

Author

Dhwal Mehta

Language

EN