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About this Engineering article
Stuck fault test generation for dynamic CMOS by Asad A. Ismaeel is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Asad A. Ismaeel
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 1994
- Field
- Engineering (Physical Sciences)