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Ultrafast Electron Microscopy of Nanoscale Charge Dynamics in Semiconductors by Yannai, Michael; Dahan, Raphael; Gorlach, Alexey; Adiv, Yuval; Wang, Kangpeng; Madan, Ivan; Gargiulo, Simone; Barantani, Francesco; Dias, Eduardo J. C.; Vanacore, Giovanni Maria; Rivera, Nicholas; Carbone, Fabrizio; de Abajo, F. Javier García; Kaminer, Ido is a scholarly article available to read on EtoBox.

What is Ultrafast Electron Microscopy of Nanoscale Charge Dynamics in Semiconductors about?

The ultrafast dynamics of charge carriers in solids plays a pivotal role in emerging optoelectronics, photonics, energy harvesting, and quantum technology applications. However, the investigation and direct visualization of such non-equilibrium transport phenomena remains as a long-standing challenge, owing to the nanometer-femtosecond spatio-temporal scales at which the charge carriers evolve. Here, we propose and demonstrate a novel interaction mechanism enabling nanoscale imaging of the femtosecond dynamics of charge carriers in solids. This imaging modality, which we name charge dynamics electron microscopy (CDEM), exploits the strong interaction between terahertz (THz) electromagnetic near fields produced by the moving charges and synchronized free-electron pulses in an ultrafast scanning transmission electron microscope. The measured free-electron energy at different spatio-temporal coordinates allows us to directly retrieve the THz near-field amplitude and phase, from which we reconstruct movies of the generated charges by comparison with microscopic theory. The introduced CDEM technique thus allows us to investigate previously inaccessible spatio-temporal regimes of charge

Author

Yannai, Michael; Dahan, Raphael; Gorlach, Alexey; Adiv, Yuval; Wang, Kangpeng; Madan, Ivan; Gargiulo, Simone; Barantani, Francesco; Dias, Eduardo J. C.; Vanacore, Giovanni Maria; Rivera, Nicholas; Carbone, Fabrizio; de Abajo, F. Javier García; Kaminer, Ido

Published

2022

Language

EN