About this scholarly article

SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Stratified scattering model for inhomogeneous dielectric multilayer… by Hou, H. H.; Yang, Li; Chen, Yaolong; Fan, Y.; Xue, C. R.; Kley, Ernst-Bernhard; Li, Rongbin; Xing, J. H. is a scholarly article available to read on EtoBox.

Author

Hou, H. H.; Yang, Li; Chen, Yaolong; Fan, Y.; Xue, C. R.; Kley, Ernst-Bernhard; Li, Rongbin; Xing, J. H.

Publisher

SPIE

Published

2007

Language

EN