About this scholarly article

2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) - On using implied values in EDT-based test compression by Gebala, Marcin; Mrugalski, Grzegorz; Mukherjee, Nilanjan; Rajski, Janusz; Tyszer, Jerzy is a scholarly article available to read on EtoBox.

Author

Gebala, Marcin; Mrugalski, Grzegorz; Mukherjee, Nilanjan; Rajski, Janusz; Tyszer, Jerzy

Publisher

IEEE

Published

2014