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About this Engineering article
Single-shot Z_eff dense plasma diagnostic through simultaneous refraction and attenuation measurements with a Talbot–Lau x-ray moiré deflectometer by M. P. Valdivia; D. Stutman; M. Finkenthal is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- M. P. Valdivia; D. Stutman; M. Finkenthal
- Publisher
- The Optical Society; Optical Society of America (ISSN 1559-128X)
- Published
- 2015
- Field
- Engineering (Physical Sciences)