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About this Engineering article
Insights on the Body Charging and Noise Generation by Impact Ionization in Fully Depleted SOI MOSFETs by Marquez, Carlos; Rodriguez, Noel; Gamiz, Francisco; Ohata, Akiko is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Marquez, Carlos; Rodriguez, Noel; Gamiz, Francisco; Ohata, Akiko
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 2017
- Language
- EN
- Field
- Engineering (Physical Sciences)
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