About this scholarly article

SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Development of user-friendly software for the roughness measurement of ultra smooth surface by Li, Huiyu; Hou, Xun; Yuan, Jiahu; Li, Yuhe; Li, Qingxiang; Wyant, James C.; Wang, Hexin; Liao, Xiaohua; Zheng, Jinglin; Han, Sen is a scholarly article available to read on EtoBox.

Author

Li, Huiyu; Hou, Xun; Yuan, Jiahu; Li, Yuhe; Li, Qingxiang; Wyant, James C.; Wang, Hexin; Liao, Xiaohua; Zheng, Jinglin; Han, Sen

Publisher

SPIE

Published

2006

Language

EN