About this scholarly article
SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 7 April 2008)] Optical Micro- and Nanometrology in Microsystems Technology II - Pixel size determination of a monitor using moire fringe by Abolhassani, Mohammad; Daman, Rahil; Gorecki, Christophe; Asundi, Anand K.; Osten, Wolfgang is a scholarly article available to read on EtoBox.
- Author
- Abolhassani, Mohammad; Daman, Rahil; Gorecki, Christophe; Asundi, Anand K.; Osten, Wolfgang
- Publisher
- SPIE
- Published
- 2008
- Language
- EN