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About this Engineering article
Study of Single-Event Transients in High-Speed Operational Amplifiers by Jaulent, P.; Pouget, V.; Lewis, D.; Fouillat, P. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Jaulent, P.; Pouget, V.; Lewis, D.; Fouillat, P.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)
- Published
- 2008
- Language
- EN
- Field
- Engineering (Physical Sciences)
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