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A Process-Variation-Tolerant On-Chip CMOS Thermometer for Auto Temperature Compensated Self-Refresh of Low-Power Mobile DRAM by Shim, Daeyong; Jeong, Hyunsik; Lee, Hyunjoong; Rhee, Cyuyeol; Jeong, Deog-Kyoon; Kim, Suhwan is a Engineering article available to read on EtoBox.
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- Author
- Shim, Daeyong; Jeong, Hyunsik; Lee, Hyunjoong; Rhee, Cyuyeol; Jeong, Deog-Kyoon; Kim, Suhwan
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9200)
- Published
- 2013
- Field
- Engineering (Physical Sciences)