About this scholarly article

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Polarization Measurement, Analysis, and Applications V - Sensitive measurements of two-dimensional birefringence distributions using near-circularly polarized beam by Shribak, Michael I.; Oldenbourg, Rudolf; Goldstein, Dennis H.; Chenault, David B. is a scholarly article available to read on EtoBox.

Author

Shribak, Michael I.; Oldenbourg, Rudolf; Goldstein, Dennis H.; Chenault, David B.

Publisher

SPIE

Published

2002

Language

EN