About this scholarly article

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Optical System Alignment, Tolerancing, and Verification VI - Practical alignment using an autostigmatic microscope by Parks, Robert E.; Sasián, José; Youngworth, Richard N. is a scholarly article available to read on EtoBox.

Author

Parks, Robert E.; Sasián, José; Youngworth, Richard N.

Publisher

SPIE

Published

2012

Language

EN