About this scholarly article

2006 13th IEEE International Conference on Electronics, Circuits and Systems - Nyquist-criterion based design of a CT ΣΔ-ADC with a reduced number of comparators by De Maeyer, J.; Rombouts, P.; Weyten, L. is a scholarly article available to read on EtoBox.

Author

De Maeyer, J.; Rombouts, P.; Weyten, L.

Publisher

IEEE

Published

2006

Language

EN