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About this Materials Science article
Energy dependent XPS measurements on thin films of a poly(vinyl methyl ether)/polystyrene blend concentration profile on a nanometer resolution to understand the behavior of nanofilms by Gawek, Marcel (author);Madkour, Sherif (author);Szymoniak, Paulina (author);Radnik, Jörg (author);Schönhals, Andreas (author) is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Gawek, Marcel (author);Madkour, Sherif (author);Szymoniak, Paulina (author);Radnik, Jörg (author);Schönhals, Andreas (author)
- Publisher
- Royal Society of Chemistry (RSC)
- Published
- 2021
- Field
- Materials Science (Physical Sciences)