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Mechanical stress evolution and the blech length: 2D simulation of early electromigration effects by V. Petrescu; A.J. Mouthaan; W. Schoenmaker; C. Salm is a Engineering article available to read on EtoBox.

What is Mechanical stress evolution and the blech length: 2D simulation of early electromigration effects about?

Modeling of stress and electromigration at the microscopic level, in confined interconnect metallic lines with tungsten studs, can very well account for the resistance behaviour in time. The resistance change at saturation for a metallic line with blocking boundaries at both ends can be related, according to the model, to threshold product (jL)c found by Blech [1].

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Author

V. Petrescu; A.J. Mouthaan; W. Schoenmaker; C. Salm

Publisher

Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)

Published

1998

Language

EN

Field

Engineering (Physical Sciences)