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Accuracy evaluation of NIST-F1 by Jefferts, S R; Shirley, J; Parker, T E; Heavner, T P; Meekhof, D M; Nelson, C; Levi, F; Costanzo, G; Marchi, A De; Drullinger, R; Hollberg, L; Lee, W D; Walls, F L is a Engineering article available to read on EtoBox.

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Author
Jefferts, S R; Shirley, J; Parker, T E; Heavner, T P; Meekhof, D M; Nelson, C; Levi, F; Costanzo, G; Marchi, A De; Drullinger, R; Hollberg, L; Lee, W D; Walls, F L
Publisher
Institute of Physics; IOP Publishing; Institute of Physics Publishing; Publons (ISSN 0026-1394)
Published
2002
Language
EN
Field
Engineering (Physical Sciences)

More by Jefferts, S R; Shirley, J; Parker, T E; Heavner, T P; Meekhof, D M; Nelson, C; Levi, F; Costanzo, G; Marchi, A De; Drullinger, R; Hollberg, L; Lee, W D; Walls, F L

Browse all works by Jefferts, S R; Shirley, J; Parker, T E; Heavner, T P; Meekhof, D M; Nelson, C; Levi, F; Costanzo, G; Marchi, A De; Drullinger, R; Hollberg, L; Lee, W D; Walls, F L