About this scholarly article

20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) - Securing Scan Design Using Lock and Key Technique by Lee, J.; Tehranipoor, M.; Patel, C.; Plusquellic, J. is a scholarly article available to read on EtoBox.

Author

Lee, J.; Tehranipoor, M.; Patel, C.; Plusquellic, J.

Publisher

IEEE Comput. Soc

Published

2005