About this scholarly article

2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Experiment and analysis of transient ionizing radiation effects in 0.5um bulk CMOS buffer by Li, Tongde; Zhao, Yuanfu; Wang, Liang; Zheng, Hongchao; Chen, Maoxin; Shu, Lei; Liu, Jiaqi is a scholarly article available to read on EtoBox.

Author

Li, Tongde; Zhao, Yuanfu; Wang, Liang; Zheng, Hongchao; Chen, Maoxin; Shu, Lei; Liu, Jiaqi

Publisher

IEEE

Published

2017

Language

EN