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About this Materials Science article
High throughput screening of novel oxide conductors using SIMS by S. Fearn; J.C.H. Rossiny; J.A. Kilner; Y. Zhang; L. Chen is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- S. Fearn; J.C.H. Rossiny; J.A. Kilner; Y. Zhang; L. Chen
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0169-4332)
- Published
- 2006
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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