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About this Physics and Astronomy article
Depth profiling of magnetic and atomic structures of ultrathin films by depth-resolved XMCD and XAFS techniques with a sub-nm depth resolution by Amemiya, K; Miyawaki, J; Abe, H; Sako, E O; Sakamaki, M is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Amemiya, K; Miyawaki, J; Abe, H; Sako, E O; Sakamaki, M
- Publisher
- Institute of Physics; IOP Publishing (ISSN 1742-6588)
- Published
- 2009
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)
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