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About this Engineering article
Atomic Force Microscope Integrated with a Scanning Electron Microscope for Correlative Nanofabrication and Microscopy by Rangelow, Ivo W.; Kaestner, Marcus; Ivanov, Tzvetan; Ahmad, Ahmad; Lenk, Steve; Lenk, Claudia; Guliyev, Elshad; Reum, Alexander; Hofmann, Martin; Reuter, Christoph; Holz, Mathias is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Rangelow, Ivo W.; Kaestner, Marcus; Ivanov, Tzvetan; Ahmad, Ahmad; Lenk, Steve; Lenk, Claudia; Guliyev, Elshad; Reum, Alexander; Hofmann, Martin; Reuter, Christoph; Holz, Mathias
- Publisher
- AVS (American Vacuum Society); American Vacuum Society; American Institute of Physics; AVS Science and Technology Society (ISSN 1520-8567)
- Published
- 2018
- Field
- Engineering (Physical Sciences)