About this scholarly article

SPIE Proceedings [SPIE 23rd Annual Technical Symposium - San Diego (Monday 27 August 1979)] Interferometry - Low-Cost High-Resolution Spectral Measurements Of Solar And Atmospheric Lines Using A Commercially Available Scanning Interferometer by Bruce, Jr., Rufus E.; Graves, J. E.; Hopkins, George W. is a scholarly article available to read on EtoBox.

Author

Bruce, Jr., Rufus E.; Graves, J. E.; Hopkins, George W.

Publisher

SPIE

Published

1979

Language

EN