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About this Computer Science article
A Unified Approach of Testing Coverage‐based Software Reliability Growth Modelling with Fault Detection Probability, Imperfect Debugging, and Change Point by Chatterjee, Subhashis; Shukla, Ankur is a Computer Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Computer Science.
- Author
- Chatterjee, Subhashis; Shukla, Ankur
- Publisher
- Wiley (John Wiley & Sons); John Wiley and Sons Ltd; Wiley (ISSN 2047-7473)
- Published
- 2018
- Language
- EN
- Field
- Computer Science (Physical Sciences)