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About this Computer Science article

A Unified Approach of Testing Coverage‐based Software Reliability Growth Modelling with Fault Detection Probability, Imperfect Debugging, and Change Point by Chatterjee, Subhashis; Shukla, Ankur is a Computer Science article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Computer Science.

Author
Chatterjee, Subhashis; Shukla, Ankur
Publisher
Wiley (John Wiley & Sons); John Wiley and Sons Ltd; Wiley (ISSN 2047-7473)
Published
2018
Language
EN
Field
Computer Science (Physical Sciences)