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About this Engineering article
Study on the Optimization of Eddy Current Testing Coil and the Defect Detection Sensitivity by Zhou, H.T.; Hou, K.; Pan, H.L.; Chen, J.J.; Wang, Q.M. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Zhou, H.T.; Hou, K.; Pan, H.L.; Chen, J.J.; Wang, Q.M.
- Publisher
- Elsevier ; [Oxford]: Elsevier Ltd.; Elsevier BV (ISSN 1877-7058)
- Published
- 2015
- Field
- Engineering (Physical Sciences)
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