About this scholarly article
SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 5 April 2010)] Enhanced and Synthetic Vision 2010 - An evaluation test bed for enhanced vision by Doehler, Hans-Ullrich; Güell, Jeff J.; Bernier, Kenneth L.; Peinecke, Niklas is a scholarly article available to read on EtoBox.
- Author
- Doehler, Hans-Ullrich; Güell, Jeff J.; Bernier, Kenneth L.; Peinecke, Niklas
- Publisher
- SPIE
- Published
- 2010
- Language
- EN