About this scholarly article

SAE Technical Paper Series [SAE International Aerospace Technology Conference and Exposition - (SEP. 23, 1992)] SAE Technical Paper Series - Role of Micron - Sized Roughness in Swept - Wing Transition by Radeztsky, Ronald H.; Reibert, Mark S.; Saric, William S.; Takagi, Shohei is a scholarly article available to read on EtoBox.

Author

Radeztsky, Ronald H.; Reibert, Mark S.; Saric, William S.; Takagi, Shohei

Publisher

SAE International

Published

1992

Language

EN