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Corrections for scattering in X‐ray fluorescence experiments by H. D. Keith; T. C. Loomis is a Physics and Astronomy article available to read on EtoBox.

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## Abstract Coherent and incoherent scattering processes are commonly ignored, or at best estimated only crudely, in X‐ray fluorescence experimently designed either to measure physical constants or to effect nondestructive chemical analysis of mixtures and alloys. The influence of this scattering is of second order, but is nevertheless large enough (generally 2–5%) to overshadow inherent errors in experimental measurement. In this paper, we develop a formalsim for calculating scattering corrections applicable to experiments involving either thin polycrystalline or amorphus samples studied in transmission or thick samples of a similar kind examined using reflection geometry. Our principal approximations are physical; we assume (i) that crystal line structure and texture in the sample serve merely to modulate the angular distribution of coherent scattering can be ignored. Mathermatical development of the model is essentially exact. Adequacy of approxination (i) is supported by previously published experimental and theoretical work; as for approximation (ii), we have found that results do not depend crucially upon the particular angular distribution function assumed for scattering. We

Who reads Corrections for scattering in X‐ray fluorescence experiments?

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Author
H. D. Keith; T. C. Loomis
Publisher
John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley (ISSN 0049-8246)
Published
1978
Language
EN
Field
Physics and Astronomy (Physical Sciences)

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