Skip to content

Opening book details…

About this Engineering article

Verification of Three-dimensional Charge Transport Simulations Using Ion Microbeams by K.M. Horn; P.E. Dodd; M.B.H. Breese; B.L. Doyle is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
K.M. Horn; P.E. Dodd; M.B.H. Breese; B.L. Doyle
Publisher
Elsevier Science; Elsevier ; Elsevier BV (ISSN 0168-583X)
Published
1997
Language
EN
Field
Engineering (Physical Sciences)

More by K.M. Horn; P.E. Dodd; M.B.H. Breese; B.L. Doyle

Browse all works by K.M. Horn; P.E. Dodd; M.B.H. Breese; B.L. Doyle