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About this Materials Science article
Structural characterization of Au/Co multilayers by x-ray diffraction, x-ray reflectivity and glancing-incidence x-ray fluorescence by W.W. v.d. Hoogenhof; T.W. Ryan is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- W.W. v.d. Hoogenhof; T.W. Ryan
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0304-8853)
- Published
- 1993
- Field
- Materials Science (Physical Sciences)