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About this Materials Science article

Electron energy-loss spectroscopy as an analytical tool in the study of TiSi2/Si interfaces by Yu.M. Shulga; V.G. Glebovsky; Yu.Ch. Dulinets; V.I. Rubtsov; Yu.G. Borodko is a Materials Science article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Materials Science.

Author
Yu.M. Shulga; V.G. Glebovsky; Yu.Ch. Dulinets; V.I. Rubtsov; Yu.G. Borodko
Publisher
Elsevier Science; Elsevier ; Elsevier BV (ISSN 0167-577X)
Published
1993
Field
Materials Science (Physical Sciences)

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