About this scholarly article
SPIE Proceedings [SPIE Seventeenth International School on Quantum Electronics: Laser Physics and Applications - Nessebar, Bulgaria (Monday 24 September 2012)] 17th International School on Quantum Electronics: Laser Physics and Applications - Laser characterization of the depth profile of complex refractive index of PMMA implanted with 50 keV silicon ions by Stefanov, Ivan L.; Stoyanov, Hristiyan Y.; Petrova, Elitza; Russev, Stoyan C.; Tsutsumanova, Gichka G.; Hadjichristov, Georgi B.; Dreischuh, Tanja N.; Daskalova, Albena T. is a scholarly article available to read on EtoBox.
- Author
- Stefanov, Ivan L.; Stoyanov, Hristiyan Y.; Petrova, Elitza; Russev, Stoyan C.; Tsutsumanova, Gichka G.; Hadjichristov, Georgi B.; Dreischuh, Tanja N.; Daskalova, Albena T.
- Publisher
- SPIE
- Published
- 2013
- Language
- EN