About this scholarly article

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Optical Manufacturing and Testing III - Error analysis for CGH optical testing by Chang, YuChun R.; Burge, James H.; Stahl, H. Philip is a scholarly article available to read on EtoBox.

Author

Chang, YuChun R.; Burge, James H.; Stahl, H. Philip

Publisher

SPIE

Published

1999

Language

EN