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RF and Microwave Material Measurements Techniques and Applications by Ssm Ssm is a document available to read on EtoBox.

Continual demand to accurately measure dielectric and magnetic properties of materials is a common need and is apparent in our every day lives. There is a need to quantitatively characterize material properties at RF and microwave frequencies. Learn more about the use of vector network analyzers (VNAs) as a flexible and versatile tool to accurately and quantitatively characterize material properties and showcase the broad applicability of the VNA as a tool to accurately do this at high frequenci

Author

Ssm Ssm

Language

EN