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About this Engineering article
Direct Measurement of Ambipolar Diffusion in Bulk Silicon by Ultrafast Infrared Imaging of Laser-induced Microplasmas by Mouskeftaras, Alexandros; Chanal, Margaux; Chambonneau, Maxime; Clady, Raphaël; Utéza, Olivier; Grojo, David is a Engineering article available to read on EtoBox.
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- Author
- Mouskeftaras, Alexandros; Chanal, Margaux; Chambonneau, Maxime; Clady, Raphaël; Utéza, Olivier; Grojo, David
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2016
- Language
- EN
- Field
- Engineering (Physical Sciences)