About this scholarly article

Proceedings of the conference on Design, automation and test in Europe - DATE '08 - Re-examining the use of network-on-chip as test access mechanism by Yuan, Feng; Huang, Lin; Xu, Qiang is a scholarly article available to read on EtoBox.

Author

Yuan, Feng; Huang, Lin; Xu, Qiang

Publisher

ACM Press

Published

2008

Language

EN