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About this Physics and Astronomy article
On the Effect of Local Sample Slope During Modulus Measurements by Contact-resonance Atomic Force Microscopy by Heinze, K.; Arnould, O.; Delenne, J.-Y.; Lullien-Pellerin, V.; Ramonda, M.; George, M. is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Heinze, K.; Arnould, O.; Delenne, J.-Y.; Lullien-Pellerin, V.; Ramonda, M.; George, M.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0304-3991)
- Published
- 2018
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)