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About this Engineering article
Modeling and Simulation-Based Layout Optimization for Tolerance to TID Effect on n-MOSFET by Lee, Minwoong (author);Lee, Namho (author);Kim, Jongyeol (author);Hwang, Younggwan (author);Cho, Seongik (author) is a Engineering article available to read on EtoBox.
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- Author
- Lee, Minwoong (author);Lee, Namho (author);Kim, Jongyeol (author);Hwang, Younggwan (author);Cho, Seongik (author)
- Publisher
- MDPI AG
- Published
- 2021
- Field
- Engineering (Physical Sciences)