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Elimination of Thermal Strain Interference in Mechanical Strain Measurement at High Temperature Using an EFPI-RFBG Hybrid Sensor With Unlimited Cavity Length by Jian, Nan; Dongsheng, Zhang; Xiaoyan, Wen; Min, Li; Haifei, Lv; Kai, Su is a Engineering article available to read on EtoBox.
What is Elimination of Thermal Strain Interference in Mechanical Strain Measurement at High Temperature Using an EFPI-RFBG Hybrid Sensor With Unlimited Cavity Length about?
Mechanical strain measurement at high temperature is a challenge due to thermal strain interference caused by material thermal expansion. In this paper, a novel hybrid sensor possessing unlimited cavity length was developed to eliminate thermal strain interference in mechanical strain measurement at high temperature. The sensor was composed by an extrinsic Fabry-Perot interferometric (EFPI) with unlimited cavity length which performs large strain measurement, and a gold-coated regenerative fiber Bragg grating (RFBG) with high reflectivity to fulfil temperature sensing. Sensing performance was tested on a ceramic cantilever. Firstly cantilever and the sensor was heated from room temperature to 800 °C without mechanical load. Pure thermal strain as large as 6500 με was measured by EFPI. At the same time temperature was measured by RFBG with a sensitivity of (10.98+0.00831T) pm/ °C. Thermal strain data was fitted as a quadratic equation of temperature with a thermal strain-temperature coefficient of (6.407+0.00542T) με/ °C . This relation still stands when mechanical load is introduced along with heating. In that case, temperature could be recorded by RFBG to get thermal strain, and t
Who reads Elimination of Thermal Strain Interference in Mechanical Strain Measurement at High Temperature Using an EFPI-RFBG Hybrid Sensor With Unlimited Cavity Length?
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Jian, Nan; Dongsheng, Zhang; Xiaoyan, Wen; Min, Li; Haifei, Lv; Kai, Su
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1530-437X)
- Published
- 2020
- Language
- EN
- Field
- Engineering (Physical Sciences)
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