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What is Test Ability about?
The document discusses Design for Testability (DFT) techniques in digital circuit testing, emphasizing the importance of considering testability during the design process to enhance quality and reduce costs. It outlines key factors affecting test complexity, such as controllability, observability, and predictability, and presents various ad hoc DFT techniques to improve testability. Additionally, it covers scan registers and boundary scan standards, highlighting their roles in facilitating effective testing
- Author
- akhileshsugowda
- Language
- EN