About this scholarly article

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Design and experiment of testing an off-axis aspheric surface by computer generated hologram by Li, Shijie; Lehmann, Peter H.; Osten, Wolfgang; Wu, Fan; Chen, Qiang; Albertazzi, Armando; Fan, Bin; Li, Lianghong is a scholarly article available to read on EtoBox.

Author

Li, Shijie; Lehmann, Peter H.; Osten, Wolfgang; Wu, Fan; Chen, Qiang; Albertazzi, Armando; Fan, Bin; Li, Lianghong

Publisher

SPIE

Published

2013