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About this Chemistry article
Depth profiling of yttria-stabilized zirconia film by SIMS. by YAKAWA, Chiori; SANO, Hiroshi; SASAKI, Hirokazu; NAKAYAMA, Toshiro is a Chemistry article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Chemistry.
- Author
- YAKAWA, Chiori; SANO, Hiroshi; SASAKI, Hirokazu; NAKAYAMA, Toshiro
- Publisher
- Japan Science and Technology Information Aggregator, Electronic; Japan Society for Analytical Chemistry (ISSN 0525-1931)
- Published
- 1994
- Field
- Chemistry (Physical Sciences)
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