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About this Engineering article
Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project by Ben Dhia, S.; Boyer, A. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Ben Dhia, S.; Boyer, A.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 2013
- Language
- EN
- Field
- Engineering (Physical Sciences)